专利名称：Microscope and method for operating a
microscope
发明人：Joerg Bewersdorf,Hilmar Gugel申请号：US10037851申请日：20020104公开号：US06798569B2公开日：20040928
专利附图：
摘要：The present invention concerns a microscope, in particular a confocal or doubleconfocal scanning microscope, as well as a method for operating a microscope, at leastone specimen support unit associated with the specimen being provided, at least one
reference specimen of known configuration being provided, and the reference specimenbeing detectable by light microscopy for calibration, alignment or adjustment of themicroscope. With the microscope according to the present invention and the methodaccording to the invention for operating a microscope, drift-related changes can bedetected and compensated for. Auxiliary means with which a specimen can easily andreliably be focused are also provided.
申请人：LEICA MICROSYSTEMS HEIDELBERG GMBH
代理机构：Davidson, Davidson & Kappel, LLC
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