专利名称：Method for taking automated inventory of
assets and recognition of the same asset onmultiple scans
发明人：Rajendra Bhagwatisingh Panwar,Jonathan
Robert Avrach
申请号：US12587162申请日：20091002
公开号：US20100030776A1公开日：20100204
专利附图：
摘要：A computer system comprising a matching platform that has the capability to
examine attributes from multiple scans on multiple attributes and determine whichattributes from each scan pertain to the same attribute so the attribute is not countedtwice. Extensible modules of weighted attribute matching rules can be plugged into thesystem which define the rules for matching based upon attributes. These modules definewhich attributes will be examined and the weighting of each in the matching process. Themodules can contain different attributes and different weighting rules for different typesof machines. With regard to weighting, when a match between attributes that arereturned from two different scans occurs, the amount that match contributes toward thedecision that the assets the attributes were collected from are the same asset dependsupon the weighting of the particular attribute. Fuzzy snapshots and time-based reportingare possible. Matching is done on devices first, then elements installed on those devicessuch as software. Confidence metrics can be developed based upon the weights ofmatches. All matching is done against a set of attributes in the persistent data warehousewhich comprise the complete set of attributes collected about a device or element fromall previous scans.
申请人：Rajendra Bhagwatisingh Panwar,Jonathan Robert Avrach
地址：Mountain View CA US,Menlo Park CA US
国籍：US,US
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