专利名称：Conductive micro-probe and memory device发明人：Gibson, Gary,Yagi, Takaaki申请号：EP98110219.7申请日：19980604公开号：EP0884557B1公开日：20050824
摘要：A micro-probe that has little deformation and wear while maintaining a desiredconductivity is composed of a cylindrical wear resistant material and a conductivematerial. The wear resistant material provides mechanical contact with a contact target,while the conductive material provides an electrical contact with the contact target. Theinvention thus provides an ultra-small micro-probe having a long useful life, and thatexperiences little deformation or wear while maintaining the desired conductivity.
申请人：HEWLETT PACKARD CO
地址：US
国籍：US
代理机构：Liesegang, Roland
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