专利名称：Method of measuring skew angles发明人：Spitz, A. Lawrence申请号：EP90313970.7申请日：19901220公开号：EP0434415A3公开日：19911121
专利附图：
摘要：Skew angle of an image is determined based on determination of location offiducial points on the image. Fiducial points may be located through a comparison of thescanning of a first line with scanning of a subsequent line. These fiducial points may bedefined in terms of pixel color transitions located on a first scan line without a
corresponding transition on the succeeding scan line. Skew angle may be determinedfrom image data in uncompressed form or in compressed form. Where skew angle isdetermined from image data in compressed form, the two-dimensional CCITT facsimilerecommendations may be used. In such cases, the locations of the fiducial points may betaken as the locations of the pass codes of the compressed image data. Specifically, passcodes indicating a pass of white pixels are used.
申请人：XEROX CORPORATION
地址：Xerox Square Rochester New York 14644 US
国籍：US
代理机构：Reynolds, Julian David
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