Integrated circuit chip testing apparatus

专利名称：Integrated circuit chip testing apparatus发明人：Keith L. Volz,Robert M. Renn,Robert D.

Irlbeck,Frederick R. Deak

申请号：US08/250267申请日：19940527公开号：US05493237A公开日：19960220

摘要：This disclosure relates to testing apparatus (10), preferably an LGA burn-in testsocket, for an integrated chip (28). The apparatus (10), arranged for mounting on a planarelectronic device (46), such as a printed circuit board, includes a frame member (12) formounting to the planar electronic device (46), where the frame member (12) includes acentral opening (22) extending between first and second surfaces, and dimensionallysized to receive the chip (28). Recesses (35) are provided for receiving an electronicinterface member (18) mounting plural flexible electrical connectors (106), such as anelastomeric connector, as known in the art, for engaging the traces or pads of the chip tothe planar device during testing. Further, plural recesses (40) extend from at least thefirst surface, where each recess includes a compression spring (41). Positioned over andfor engagement with the frame member is a floatably mounted force applying member(14) having first and second parallel surfaces. A central opening (75), concentric with thecentral opening ( 22) of the frame member (12) is present. Additionally, plural posts (62)extend from the second parallel surface for receipt in respective recesses (44). Finally,camming levers (16) are provided for urging the force applying member toward theframe member, along with pivotal pusher members (78) responsive to the camming

levers to engage and secure the chip during testing thereof.

申请人：THE WHITAKER CORPORATION

代理人：Timothy J. Aberle

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