专利名称：Correction of Rotation Rate Measurements发明人：Adrián Guillermo Ledroz申请号：US15865083申请日：20180108
公开号：US20180128643A1公开日：20180510
专利附图：
摘要：Various implementations directed to correction of rotation rate measurementsare provided. In one implementation, a method may include receiving rotation ratemeasurements about a first axis and a second axis from first gyroscopic sensors. Themethod may include receiving a first rotation rate measurement about a third axis from a
second gyroscopic sensor. The method may include determining an estimated rotationrate measurement about the third axis based on the rotation rate measurements aboutthe first axis and the second axis. The method may include determining a bias value basedon a difference between the first rotation rate measurement about the third axis and theestimated rotation rate measurement. The method may include receiving second rotationrate measurements about the third axis from the second gyroscopic sensor. The methodmay include correcting the second rotation rate measurements about the third axisbased on the determined bias value.
申请人：Gyrodata, Incorporated
地址：Houston TX US
国籍：US
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